Modular wireless communication device testing system

ABSTRACT

Arrangements and techniques for testing mobile devices within a test module. The test modules are portable and may be stacked to provide a modular testing system. A pulley system may be used to move an actuator arm horizontally in the X and Y directions. The actuator arm may be moved vertically in the Z direction such that a tip may engage a touchscreen of a mobile device being tested or a user interface element of the mobile device.

PRIORITY CLAIM AND CROSS-REFERENCE TO RELATED APPLICATIONS

This Application is a non-provisional of, and claims priority under 35USC § 119(e), to U.S. Provisional Patent Application No. 62/693,331,filed Jul. 2, 2018, which is fully incorporated by reference herein asif fully set forth below.

BACKGROUND

In recent years, mobile telecommunication devices have advanced fromoffering simple voice calling services within wireless communicationnetworks to providing users with many new features. Mobiletelecommunication devices now provide messaging services such as email,text messaging, and instant messaging; data services such as internetbrowsing; media services such as storing and playing a library offavorite songs; location services; and many others. In addition to thenew features provided by the mobile telecommunication devices, users ofsuch mobile telecommunication devices have greatly increased. Such anincrease in users is only expected to continue and, in fact, it isexpected that there could be a growth rate of twenty times more users inthe next few years alone.

With the growth in users of mobile telecommunication devices, theconstant stream of mobile communication innovation goes hand in handwith competition among operators of wireless communication networks.Thus, operators of wireless communication networks need to maintain acomprehensive knowledge of the technologies and mobile telecommunicationdevices that are being released and put into user's hands. One way ofmaintaining such an understanding is through extensive testing of themobile telecommunication devices supported by wireless communicationnetworks.

Currently, many different tests are performed on mobiletelecommunication devices in order to ensure that manufacturers of suchdevices are producing the devices in compliance with various standardsand protocols for wireless communication networks. Additionally, testsmay be performed for safety and network compatibility of the mobiletelecommunication devices. Such testing responsibilities may beexpensive and time consuming such that operators of wirelesstelecommunication networks have worked to automate the testing processthrough the use of robotic test systems. While such robotic testingplatforms for simulating user input on mobile telecommunication devicesmay provide a great deal of savings in time and money over manualmethods, current robotic testing platforms are still quite costly,occupy a large amount of precious laboratory space, e.g., laboratoryspace for testing of mobile telecommunication devices, and still requirea significant amount of technician labor, e.g., manual labor.

BRIEF DESCRIPTION OF THE DRAWINGS

The detailed description is set forth with reference to the accompanyingfigures, in which the left-most digit of a reference number identifiesthe figure in which the reference number first appears. The use of thesame reference numbers in different figures indicates similar oridentical items or features.

FIG. 1 illustrates an example of a test module for a modular testingsystem, in accordance with various configurations.

FIG. 2A illustrates an example of a stackable test module similar to thetest module illustrated in FIG. 1, in accordance with variousconfigurations.

FIG. 2B illustrates an example of stackable test modules of FIG. 2Astacked to provide a modular testing system, in accordance with variousconfigurations.

FIG. 3 schematically illustrates a motion system for moving a carriageassembly of the test module of FIG. 1 horizontally in the X and Ydirections, in accordance with various configurations.

FIG. 4 is a close-up view of the belts of the motion system attached toa top portion of the carriage assembly, in accordance with variousconfigurations.

FIG. 5 is a partial exploded view of an actuator arm of the test moduleof FIG. 1, in accordance with various configurations.

FIG. 6A is an exploded view of an actuator arm assembly for use with theactuator arm, in accordance with various configurations.

FIG. 6B illustrates a completed actuator arm for use with the testmodule of FIG. 1, in accordance with various configurations.

FIG. 7 is another view of a test module that illustrates the actuatorarm coupled to the carriage assembly, in accordance with variousconfigurations.

FIG. 8 is a partial exploded view of a component drawer of the testmodule of FIG. 1, in accordance with various configurations.

FIG. 9 is an overhead view of an example device platform for securing amobile device as a device under test (DUT) on a test bed of the testmodule of FIG. 1, in accordance with various configurations.

FIG. 10 illustrates another example device platform for use with thetest module of FIG. 1, in accordance with various configurations.

FIG. 11 is a flowchart illustrating a method of testing mobile deviceswithin the test module of FIG. 1, in accordance with variousconfigurations.

DETAILED DESCRIPTION

Described herein are arrangements and techniques for testing mobiletelecommunication devices, also referred to herein as mobile devices,within modules of a modular mobile device testing system. The modulesmay be stackable and may be operated remotely from a central hostsystem.

For example, a test room or laboratory space operated by an operator ofa wireless communication network may include modules of the modularmobile testing system to test various mobile devices. The mobile devicesmay comprise any appropriate device, e.g., a stationary device or aportable electronic device, for communicating over a wirelesscommunication network. Examples of such devices include mobiletelephones, cellular telephones, internet protocol (IP) telephones,mobile computers, Personal Digital Assistants (PDAs), radio frequencydevices, handheld computers, laptop computers, tablet computers,palmtops, pagers, devices configured as IoT devices, IoT sensors thatinclude cameras, integrated devices combining one or more of thepreceding devices, and/or the like. As such, the mobile devices mayrange widely in terms of capabilities and features.

In configurations, each test module may employ radio frequencyidentification (RFID) to identify and track a device under test (DUT).Each module uses robotic means to affect planar positioning of anorthogonal linear motion system above a fixed DUT. The orthogonal linearmotion system engages the device with a manipulation tool, which inconfigurations is a sprung tip, effecting a validation test. The DUT isheld in place by a spring-loaded clamp that presses the device undertest against locating pins to produce a repeatable datum point. A cameramounted above the DUT can record video and/or stream video of a screenof the DUT to a computing system during testing, where the computingsystem controls the test module.

In configurations, each module has an onboard microcontroller thatmediates control of the test module. Control commands may be sent from ahost or computing device that may be located locally or remotely, theninterpreted and implemented by the onboard microcontroller. This allowsmultiple test modules to be controlled by a single host over anystandard network connection, e.g., the Internet. In configurations, themodules of the system are stackable to save space in the testing lab.The modules are also portable to be used at various locations.

In configurations, the orthogonal linear motion system comprises aCore-XY motion concept that has been developed for three-dimensional(3D) printing applications. Such a concept may be used to move avertical actuator along a horizontal plane, e.g., in X and Y directions,allowing it to be positioned precisely above a DUT. One or more motorsand pulleys may be used to drive one or more belts, which can controlthe horizontal location of the manipulation tool, e.g., the sprung tip.A vertical actuator may then be activated allowing manipulation of theDUT's user interface, e.g., a touchscreen of the DUT and/or UserInterface (UI) elements, e.g., buttons, on the DUT. In configurations,the sprung tip comprises a reciprocating rod with a capacitive tip thatis mounted to the vertical actuator. Such an arrangement allows forvariable force to be applied to the DUT and prevents damage to thedevice.

FIG. 1 illustrates an example configuration of a test module 100 for amodular testing system in accordance with various configurations. Thetest module 100 includes, among other components, legs 102 that define aframe. The legs 102 may include feet 104, if desired, to provide extrabalance when the test module 100 is placed on a stable surface, e.g., afloor, a table, etc. The feet 104 may not be included to allow forstacking of test modules 100, as will be discussed herein.

Sidewalls 106 may be included, as well as a door 108. As will bedescribed in more detail herein, the test module 100 may include firstand second X-Y stepper motors 110 a, 110 b for moving a carriageassembly 112 in horizontal directions, e.g., in X and Y directions.

The carriage assembly 112 includes an actuator arm 114 that includes asprung tip 116 for testing of a device under test (DUT) (notillustrated). The actuator arm 114 includes, as will be describedfurther herein, an actuator 118 for moving the sprung tip 116 in avertical direction, e.g., in the Z direction. An X-Y axis power supply120 is provided, as is a Z axis power supply 122. In configurations, asingle power supply may be provided for providing power to move thecarriage assembly 112 and the actuator arm 114 for movement in the X-Ydirections, as well as in the Z direction.

The test module 100 also includes a component drawer 124 that includes acontroller in the form of a microcontroller or computer 126 mountedthereto. The controller may also include memory 128 that provides randomaccess memory (RAM), read only memory (ROM), etc. One or more of themicrocontroller 126 and/or the memory 128 may be in the form of a SolidState Device (SSD).

FIG. 2A illustrates a stackable test module 200 similar to the testmodule 100, with various components illustrated in FIG. 1 removed. Thetest module 200 includes legs 202 without the feet 104. The legs 202 areformed with t-slot extrusions to allow for the stacking of test modules200 as illustrated in FIG. 2B. Thus, the test module 200 may be stackedon other test modules 200, as may be seen in FIG. 2B, to provide amodular testing system 204 comprising multiple test modules 200. Inconfigurations, test modules 200 on the bottom of the testing system 204may be considered base test modules and may or may not include feet 104(not illustrated in FIG. 2B).

The test module 200 also includes a DUT 206 on a test bed 208 above thedrawer 124 (not illustrated in FIG. 2A). The DUT 206 is illustratedsupported by leveling spacers 210, which in configurations may compriserubber, and held in place by adjustable pins 212 and a clamp assembly214, as will be described further herein. The test module 200 alsoincludes a pulley system 216 driven by stepper motors 110 a, 110 b tomove the carriage assembly 112 and thereby the actuator arm 114 andsprung tip 116, as will be described further herein.

FIG. 3 schematically illustrates a motion system 300, e.g., pulleysystem 216, for moving the carriage assembly 112 horizontally in the Xand Y directions. As may be seen, the first stepper motor 110 a drives afirst belt 302 attached to the carriage assembly 112 at 304 and 306. Asecond belt 308 is also coupled to the carriage assembly 112 at 310 and312 and is driven by the second stepper motor 110 b. The belts 302, 308engage multiple pulleys 314. The motion system 300 is often referred toas a Core-XY methodology.

FIG. 4 provides a close-up view of the belts 302, 308 positioned withina top portion 400 a of the carriage assembly 112. The second belt 308 islocated in the top portion 400 a of the carriage assembly 112 in slots402 a, 402 b. Set screws 404 a, 404 b may be used to secure the beltswithin the slots 402 a, 402 b. The second belt 308 is above the firstbelt 302. Thus, the first belt 302 is located in similar slots (notillustrated) in a lower portion 400 b of the carriage assembly 112 andsecured with set screws (not illustrated). Ends 406 a, 406 b of thesecond belt 308 and ends 408 a, 408 b of the first belt 302 may betrimmed off after the belts 302, 308 are secured within the carriageassembly 112. Bolts 410 may also be used to tension and align the belts302, 308 within the slots of the carriage assembly 112. Thus, the slots,set screws and/or bolts allow for simple tensioning and alignment of thebelt.

FIG. 5 provides a partial exploded view of the actuator arm 114 that iscoupled to and extends from the carriage assembly 112. The actuator arm114 includes a base 502 that includes a motor 504 for actuating andmoving an actuator bracket 506 vertically, e.g., in the Z direction.Thus, the base 502 and the motor 504 may serve as the actuator 118. Anactuator arm body 508 is coupled to the base 502 such that a shaft 510of the motor 504 is within the actuator arm body 508 and engages anactuator shaft 512. The actuator shaft 512 moves the actuator bracket506 along the actuator shaft 512 when the actuator shaft 512 rotates.

FIG. 6A is an exploded view of an actuator arm assembly 600 that may beused as an actuator arm 114. The actuator arm assembly 600 includes anactuator arm mount 602 coupled to the actuator bracket 506. A spring 604serves as a force regulator and includes an actuator rod 606 that is fedthrough the actuator arm mount 602 and engages the spring 604. A tipshaft 608 is fed through a washer 610 to engage the spring 604 and a nut612 is placed over the opposite end of the actuator rod 606 to securecomponents to the actuator arm mount 602. A tip 614, which inconfigurations may comprise rubber, is placed over an end of the tipshaft 608. FIG. 6B illustrates the completed actuator arm 114 that maybe coupled to the carriage assembly 112 so that the actuator arm 114 maybe moved horizontally in the X and Y directions and vertically in the Zdirection.

FIG. 7 is another view of a test module 100 that illustrates theactuator arm 114 coupled to the carriage assembly 112. The base 502 maybe coupled to the carriage assembly 112 with appropriate hardware (notillustrated) such as, for example, screws, rivets, etc. The test module100 illustrated in FIG. 7 does not include the sidewalls 106 or the door108. The component drawer 124 is included below the test bed 208. Acamera 700 may be included for providing video during testingoperations.

In configurations, the video may be may be live streamed to a computingdevice or computing system 702, e.g., a remote server. However, inconfigurations, the computing device 702 may be located locally. Thecomputing device 702 may control the test module 100 by communicatingwith the microcontroller 126 to control movement of the carriageassembly 112, and thereby the actuator arm 114, to test DUTs 206. Thecommunication may be over a network, e.g., the Internet. The computingdevice 702 may provide test instructions to the microcontroller 126 inthe form of individual movement commands that are provide as low-levelinstructions. The microcontroller 126 may also receive test resultselectronically from DUTs 206 in addition to the video from the camera700 and may provide the results to the computing device 702. Thus, theorchestration, timing, analysis of results, etc. of testing of DUTs 206by the test module 100 may be handled remotely with respect to the testmodule 100 by the computing device 702.

In configurations, the computing device 702 may control multiple testmodules 100 in concert. Such control of multiple test modules 100 inconcert enables live testing of features of DUTs 206 such as, forexample, group texting. In configurations, the microcontroller 126, orsome other component (not illustrated) may record the video.

The camera 700 may record video and/or still pictures. The computingdevice 702 communicates with the microcontroller 126 and may be locatedlocally or remotely. The camera 700 may provide the video and/or stillpictures to the microcontroller 126, the memory 128 and/or the computingdevice 702. As can be seen, the camera 700 is located between the twobelts 302, 308 above a DUT test area 704 so that the belts 302, 308 donot interfere with the camera's recording of testing operations of a DUT206 (not illustrated in FIG. 7).

FIG. 8 is a partial exploded view that illustrates the component drawer124 being mounted to and connected to cooperating arms 800, 802 withscrews 804 so that the component drawer 124 may slide in and out belowthe test bed 208. As previously noted, the component drawer 124 includesa microcontroller or computer 126 and memory 128. The microcontroller126 controls the various components of the test module 100 forperforming tests of mobile devices. The microcontroller 126 may includea status indicator 806, e.g., one or more light emitting diodes (LEDs)that indicate a status of the test module, e.g., on, off, testing,testing complete, etc.

The microcontroller 126 may communicate with the computing device 702 tocontrol the test module 100 for testing of mobile devices or may becontrolled directly. For example, test or control commands may bereceived by the microcontroller 126 that may be used to control movementof the carrier assembly 112 and/or the actuator arm 114.

FIG. 9 provides an overhead view of an example device platform 900 forsecuring a mobile device as a DUT 206 on the test bed 208 for testing inthe test module 100. The device platform 900 may include spacers 210,which in configurations are rubber leveling spacers, and adjustableindex pins 212. The spacers 210 and index pins 212 may be adjustedvertically and/or may be moved to different positions on the test bed208. A DUT 206 may be placed on the spacers 210 and against the indexpins 212. An adjustable clamp 902 may engage the DUT 206 and hold theDUT 206 in place against the index pins 212. The adjustable clamp 902may be moved to engage the DUT 206. A clamp set screw 904 may be used tosecure the adjustable clamp 902 against the DUT 206. Thus, such anarrangement allows for testing of various sized mobile devices.

A Radio-Frequency Identification (RFID) antenna 906 may be provided withthe test module 100 to identify mobile devices being tested based uponRFID. The RFID antenna 906 may be attached to the test bed 208 under theDUT 206 and may read a small RFID label attached to the back of a DUT206. The RFID label contains information identifying the DUT 206 and canbe used to gather test data from a central database (not illustrated)that stores test results and/or from the memory 128. The spacers 210help provide clearance between the DUT 206 and the RFID antenna 906.

FIG. 10 illustrates another example device platform 1000 for use withthe test module 100. The device platform 1000 includes leveling spacers210 and index pins 212. The spacers 210 and index pins 212 may beadjusted vertically and/or may be moved to different positions on thetest bed 208. For example, the index pins 212 may be moved to engagedifferent holes 1006 defined within the test bed 208. Two spring-loadedpins 1002 are utilized to secure a clamp 1004 against the DUT 206 inorder to secure the DUT against pins 212 for testing.

Thus, during testing, the actuator arm 114 may be moved horizontally, inthe X and/or Y direction(s), over the DUT 206 using the pulley system216/motion system 300. The actuator arm mount 602 may be moved up anddown, e.g., in the Z direction, such that the tip 614 engages the DUT206 to perform various tests. The tip 614 of the stylus assembly 600 mayengage a screen of the DUT 206, e.g., a touchscreen, and/or UserInterface (UI) elements, e.g., physical buttons, on the DUT 206 forperforming the various tests. Additionally, the washer 610 may be usedto engage UI elements, e.g., physical buttons, on a side of the DUT 206for performing various tests.

Testing with the test module 100 is provided by robotic manipulation ofthe actuator arm 114 to provide inspection of a mobile device such as aDUT 206. Mechanically, this involves two primary operations. First, thetest module 100 translates the actuator arm 114 in the horizontal (XY)plane with sufficient accuracy and precision to reliably locate elementson the DUT 206, including the touchscreen and any physical buttons.Second, the stylus assembly 600 moves in the vertical (Z) plane in orderto contact the DUT's touchscreen, as well as any physical buttons, withthe appropriate force to trigger user interface (UI) elements of the DUT206.

Movement of the tip 614 in the vertical direction simulates the tappingmotion of a human finger and allows the test module 100 to activate UIelements. A key constraint in this operation is that the force appliedto the touchscreen should be controllable to accommodate variable forcetouchscreens, and measurable to provide test validation data. Inconfigurations, the sprung stylus arrangement of the stylus assembly 600controls the force applied to the DUT's touchscreen based upon thespring 604 in combination with the actuator rod 606.

Translation in the Z direction may be accomplished by the actuator arm114 using a linear actuator control (LAC) board (not illustrated) tocontrol movement of the actuator bracket 506 by rotation of the actuatorshaft 512, and thereby move the actuator arm assembly 600. The LAC boardand the motor 504 provides potentiometer feedback allowing for real-timepositional control. The actuator arm assembly 600 utilizes the spring604 and the tip 614, which may be a capacitive tip in configurations. Asshown in FIGS. 6 and 7, the tip 604 is located on the end of theactuator rod 606. As the actuator rod 606 pushes the tip 614 of thestylus assembly 600 into the touchscreen of the DUT 206, the tip 614compresses the spring 604 against the actuator rod 606. As a result, theforce applied to the touchscreen of the DUT 206 is a smooth function ofthe vertical position of the actuator arm 114, and the elastic constantof the spring 604. Hence, the force applied to the DUT 206 may beaccurately controlled and measured.

FIG. 11 is a flow diagram of an illustrative process that may beimplemented within or in association with the test module 100 and/or thetesting system 204. This process (as well as other processes describedthroughout) is illustrated as a logical flow graph, each operation ofwhich represents a sequence of operations that can be implemented inhardware, software, or a combination thereof. In the context ofsoftware, the operations represent computer-executable instructionsstored on one or more tangible computer-readable storage media that,when executed by one or more processor(s), perform the recitedoperations. Generally, computer-executable instructions includeroutines, programs, objects, components, data structures, and the likethat perform particular functions or implement particular abstract datatypes. The order in which the operations are described is not intendedto be construed as a limitation, and any number of the describedoperations can be combined in any order and/or in parallel to implementthe process. Furthermore, while the architectures and techniquesdescribed herein have been described with respect to wireless networks,the architectures and techniques are equally applicable to processor(s)and processing cores in other environments and computing devices.

FIG. 11 is a flow diagram illustrating an example method 1100 of testingmobile devices, e.g., DUTs 206, within a test module, e.g., test module100. As illustrated, at block 1102, the mobile device is placed on adevice platform, e.g., device platforms 900, 1000, of the test module,the device platform comprising a plurality of adjustable pins, e.g.,index pins 212 and spacers, e.g., spacers 210. At block 1104, a clamp,e.g., clamps 902, 1004, of the test module engages the mobile device. Atblock 1106, a controller, e.g., microcontroller 126, of the test modulereceives from a computing device, e.g., computing device 702, one ormore test instructions to be performed. Thus, one or more testinstructions may be provided by, for example, a server, which may belocated remotely or locally. The server may provide test instructions tomultiple test modules to thereby provide live testing of features ofmobile devices, such as, for example, group texting.

At block 1108, an actuator arm, e.g., actuator arm 114, of the testmodule is moved, based at least in part on the received one or more testcommands, in at least one of a horizontal direction along an X axis or ahorizontal direction along a Y axis such that an actuator arm mountcoupled to the actuator arm is located over a screen of the mobiledevice. In configurations, the actuator arm is moved by the controllerusing a motion system, e.g., the motion system 300, based at least inpart on the test. At block 1110, the actuator arm mount is moved, basedat least in part on the received one or more test commands, in avertical direction along a Z axis such that one of (i) a tip coupled tothe actuator arm mount engages the screen or (ii) the tip engages a UserInterface (UI) element of the mobile device. In configurations, thevertical movement is based at least in part on the test. At block 1112,results of the test are provided to the computing device.

Thus, testing of mobile devices may be performed within individual testmodules 100. The test modules 100 are portable and thus, may be easilymoved by carrying the test modules 100. Also, the test modules 100 maybe stacked atop one another to provide testing systems and arrangementsthat may test multiple mobile devices.

Although the subject matter has been described in language specific tostructural features and/or methodological acts, it is to be understoodthat the subject matter defined in the appended claims is notnecessarily limited to the specific features or acts described. Rather,the specific features and acts are disclosed as exemplary forms ofimplementing the claims.

We claim:
 1. A test module for testing mobile devices, the test modulecomprising: a frame; a test bed coupled to the frame; a device platformcoupled to the test bed and configured to hold a Device Under Test(DUT); a motion system coupled to the frame and configured to move acarriage assembly horizontally along an X axis and a Y axis, the motionsystem comprising: a first belt and a second belt; a first set ofpulleys and a second set of pulleys; and a first motor and a secondmotor, wherein the first belt is engaged with the first set of pulleysand the first motor, and wherein the second belt is engaged with thesecond set of pulleys and the second motor; an actuator arm coupled tothe carriage assembly; an actuator arm mount coupled to the actuatorarm, the actuator arm mount configured to move vertically along a Z axisand engage the DUT, the actuator arm mount comprising a tip configuredto engage a screen of the DUT and one or more User Interface (UI)elements of the DUT; wherein the actuator arm mount comprises a shaftand a coil spring coupled to the tip; and a controller configured tocontrol the motion system and the actuator arm to perform various testswith respect to the DUT.
 2. The test module of claim 1, wherein the tipcomprises a capacitive tip.
 3. The test module of claim 1, furthercomprising: a sliding drawer movably coupled to the frame below the testbed, the sliding drawer being configured to slide at least partially outfrom below the test bed, wherein the controller is mounted on thesliding drawer.
 4. The test module of claim 3, further comprising: aRadio-Frequency Identification (RFID) antenna mounted on the deviceplatform, the RFID antenna configured to identify the DUT to thecontroller.
 5. The test module of claim 3, wherein the controllercomprises one or more of: a computer; Random Access Memory (RAM); or aSolid State Drive (SSD).
 6. The test module of claim 1, wherein thecontroller is configured to communicate with a computing device fortesting the DUT and for providing results of the testing to thecomputing device.
 7. The test module of claim 1, further comprising acamera coupled to the frame above the device platform.
 8. The testmodule of claim 1, wherein the device platform comprises: a plurality ofspacers configured to support the DUT; a plurality of adjustable pinsconfigured to engage the DUT; and a spring-loaded clamp configured toengage the DUT when the DUT is on the spacers.
 9. The test module ofclaim 1, wherein the frame is configured to be stacked on another frameof another test module.
 10. The test module of claim 1, furthercomprising: a status indicator configured to indicate one or more of (i)a status of the test module, or (ii) a status of testing of the DUT. 11.A testing arrangement for mobile devices, the testing arrangementcomprising a plurality of test modules, each test module comprising: aframe; a test bed coupled to the frame; a device platform coupled to thetest bed and configured to hold a Device Under Test (DUT); a motionsystem coupled to the frame and configured to move a carriage assemblyhorizontally along an X axis and a Y axis, the motion system comprising:a first belt and a second belt; a first set of pulleys and a second setof pulleys; and a first motor and a second motor, wherein the first beltis engaged with the first set of pulleys and the first motor, andwherein the second belt is engaged with the second set of pulleys andthe second motor; an actuator arm coupled to the carriage assembly; anactuator arm mount coupled to the actuator arm, the actuator arm mountconfigured to move vertically along a Z axis and engage the DUT, theactuator arm mount comprising a tip configured to engage a screen of theDUT and one or more user interface (UI) elements of the DUT; and acontroller configured to control the motion system and the actuator armto perform various tests with respect to the DUT, wherein the actuatorarm mount of each test module each comprises a shaft and a coil springcoupled to the tip.
 12. The testing arrangement of claim 11, wherein:the plurality of test modules comprise base test modules configured tobe placed on a base; and the plurality of test modules comprisestackable test modules configured to be stacked on one of (i) a basetest module, or (ii) a stackable test module.
 13. The testingarrangement of claim 11, wherein each tip comprises a capacitive tip.14. The testing arrangement of claim 11, wherein each test modulefurther comprises: a sliding drawer movably coupled to the frame belowthe test bed, the sliding drawer being configured to slide at leastpartially out from below the test bed, wherein the controller is mountedon the sliding drawer.
 15. The testing arrangement of claim 14, whereineach test module further comprises: a Radio-Frequency Identification(RFID) antenna mounted on the device platform, the RFID antennaconfigured to identify the DUT to the controller; and a camera coupledto the frame above the device platform.
 16. The testing arrangement ofclaim 11, wherein each device platform comprises: a plurality of spacersconfigured to support the DUT; a plurality of adjustable pins configuredto engage the DUT; and a spring-loaded clamp configured to engage theDUT when the DUT is on the spacers.